Mapping of gun-firing loading to high-impact testing velocity with shock response spectrum method

This paper presents an analysis of the correlation between setback and high-impact test loadings using the shock response spectrum (SRS). The modal analysis of the electronic assembly structure is implemented to determine the frequency range for the SRS analysis. A preliminary test of the high-impact tester is conducted with a reference impact velocity. Based on experimental data, finite element (FE) simulation is employed to predict the acceleration states at different impact velocities. The acceleration curves generated from FE simulation are included in the shock response spectrum for the correlation analysis. A proposed impact velocity is expected to cause a similar damage to the electronic assembly structure. This study provides valuable insight into the relationship between setback and high-impact test loadings, as well as a method for predicting and evaluating the potential damage to electronic assembly structures during high-impact testing.