A new approach to measure fundamental microstructural influences on the magnetic properties of electrical steel using a miniaturized single sheet tester

被引:6
作者
Leuning, N. [1 ]
Heller, M. [2 ]
Jaeger, M. [1 ]
Korte-Kerzel, S. [2 ]
Hameyer, K. [1 ]
机构
[1] Rhein Westfal TH Aachen, Inst Elect Machines IEM, D-52062 Aachen, Germany
[2] Rhein Westfal TH Aachen, Inst Phys Met & Mat Phys IMM, D-52062 Aachen, Germany
关键词
Electrical steel; Miniaturized single sheet tester; Single crystals; Deformation; Grain boundaries; FeSi;
D O I
10.1016/j.jmmm.2023.171000
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Magnetic properties of electrical steel are usually measured on Single Sheet Testers, Epstein frames or ring cores. Due to the geometric dimensions and measurement principles of these standardized setups, the fundamental microstructural influences on the magnetic behavior, e.g., deformation structures, crystal orientation or grain boundaries, are difficult to separate and quantify. In this paper, a miniaturized Single Sheet Tester is presented that allows the characterization of industrial steel sheets as well as from in size limited single, bi-and oligocrystals starting from samples with dimensions of 10 x 22 mm. Thereby, the measurement of global magnetic properties is coupled with microstructural analysis methods to allow the investigation of micro scale magnetic effects. An effect of grain orientation, grain boundaries and deformation structures has already been identified with the presented experimental setup. In addition, a correction function is introduced to allow quantitative comparisons between differently sized Single Sheet Testers. This approach is not limited to the presented Single Sheet Tester geometry, but can also be used to compare the results of Single Sheet Testers of various sizes. The results of the miniaturized Single Sheet Tester were validated on five industrial electrical steel grades. Furthermore, first results of differently oriented single crystals as well as measurements on grain-oriented electrical steel are shown to prove the additional value of the miniaturized Single Sheet Tester geometry.
引用
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页数:7
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