Characterization of (100)-orientated diamond film grown by HFCVD method with a positive DC bias voltage
被引:4
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马莹
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王林军
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刘建敏
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School of Materials Science and Engineering,Shanghai University,Shanghai 200072,ChinaSchool of Materials Science and Engineering,Shanghai University,Shanghai 200072,China
刘建敏
[1
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苏青峰
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School of Materials Science and Engineering,Shanghai University,Shanghai 200072,ChinaSchool of Materials Science and Engineering,Shanghai University,Shanghai 200072,China
苏青峰
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徐闰
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彭鸿雁
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史伟民
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夏义本
[1
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[1] School of Materials Science and Engineering,Shanghai University,Shanghai 200072,China
[2] Physics Department,Mudanjiang Normal College,Mudanjiang 157012,China
The (100)-orientated diamond film was deposited by hot-filament chemical vapor deposition (HFCVD) technology with a positive DC bias voltage. The morphology, X-ray diffraction (XRD), RAMAN spectrum and dark current versus applied voltage characteristics analysis show that the positive dc bias can increase the nucleation density and (100)-orientated growth, making the growth of the high quality diamond film easier and cheaper than using other methods.