Chair's Introduction to 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis

被引：0

作者：

Rueywen Liu ^{[1
]}

机构：

[1] General Chair of ICTD‘09 University of Notre Dame Notre Dame

来源：

Journal of Electronic Science and Technology | 2009年 / 7卷 / 04期

关键词：

IEEE; this; Chair’s Introduction to 2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis;

D O I：

暂无

中图分类号：

TN02-2 [];

学科分类号：

080901 ;

摘要：

Based on the recommendation of ICTD’09 TPC members, this Special Issue of the Journal of Electronic Science & Technology of China (JESTC) contained 22 high quality papers selected from the Proceedings of 2009 IEEE

引用

页码：289 / 289

页数：1