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- [1] ARXPS-analysis of sputtered TiC, SiC and Ti 0.5 Si 0.5 C layers[J] . V. Schier,H. -J. Michel,J. Halbritter.Fresenius’ Journal of Analytical Chemistry . 1993 (1)
Microanalysis on the Hydrogen Ion Irradiated 50 wt pct TiC-C Films
被引：0
作者：
Hui JIANG
机构：
关键词：
Titanium carbide;
Hydrogen ion irradiation;
Microanalysis;
D O I：
暂无
中图分类号：
TB383.2 [];
学科分类号：
070205 ;
080501 ;
1406 ;
摘要：
The 50 wt pct TiC-C films were prepared on stainless steel substrates by using a technique of ion beam mixing. These films were irradiated by hydrogen ion beam with a dose of 1×1018 ions/cm2 and an energy of 5 keV. Microanalysis of X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectroscopy (SIMS) were used to analyze the films before and after hydrogen ion irradiation and to study the mechanism of hydrogen resistance.
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页码：129 / 132
页数：4
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