Microcrystallin eStructure and Luminescence of ZnS Thin Films

被引：0
作者：
WANG Yu-jiang
机构：
来源：
Semiconductor Photonics and Technology | 2000年 / 01期
关键词：
Electroluminescence; Thin film; Microstructure;
D O I：
暂无
中图分类号：
TN304 [材料];
学科分类号：
0805 ; 080501 ; 080502 ; 080903 ;
摘要：
The electroluminescence thin films doped with erbium, fabricated by thermal evaporation with two boats, are analyzed by X-ray diffraction (XRD). The relationship between electroluminescence brightness and microstructure of the thin films is obtained. The results reveal that the large grain size in high index plane of deposited microcrystalline film has an effect on electroluminescence characteristics of the film devices.
引用
收藏
页码：20 / 22
页数：3
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