Review of ultrafast spectroscopy studies of valley carrier dynamics in two-dimensional semiconducting transition metal dichalcogenides

被引:0
作者
孙栋 [1 ,2 ]
赖佳伟 [1 ]
马骏超 [1 ]
王钦生 [1 ]
刘晶 [3 ]
机构
[1] International Center for Quantum Materials, School of Physics, Peking University
[2] Collaborative Innovation Center of Quantum Matter
[3] State Key Laboratory of Precision Measurement Technology and Instruments, School of Precision Instruments and Optoelectronic Engineering,Tianjin University
关键词
ultrafast spectroscopy; valley carrier dynamics; transition metal dichalcogenides; exciton;
D O I
暂无
中图分类号
O649 [半导体化学];
学科分类号
080501 ;
摘要
The two-dimensional layered transition metal dichalcogenides provide new opportunities in future valley-based information processing and also provide an ideal platform to study excitonic effects. At the center of various device physics toward their possible electronic and optoelectronic applications is understanding the dynamical evolution of various manyparticle electronic states, especially exciton which dominates the optoelectronic response of TMDs, under the novel context of valley degree of freedom. Here, we provide a brief review of experimental advances in using helicity-resolved ultrafast spectroscopy, especially ultrafast pump–probe spectroscopy, to study the dynamical evolution of valley-related many-particle electronic states in semiconducting monolayer transitional metal dichalcogenides.
引用
收藏
页码:152 / 163
页数:12
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