Measurement of inter-particle forces by an interfacial force microscope

被引：0

作者：

Asghar Mesbah-Nejad ^{[1
]}

Seyed M.Tadayyon ^{[2
]}

Peter Norton ^{[2
]}

Jesse Zhu ^{[3
]}

机构：

[1] Department of Electrical and Computer Engineering,The University of Western Ontario

[2] Department of Chemistry,The University of Western Ontario

[3] Particle Technology Research Centre,Department of Chemical and Biochemical Engineering,The University of Western Ontario

来源：

Particuology | 2010年 / 8卷 / 05期

关键词：

Inter-particle forces van der Waals force Interfacial force microscope Fine powder;

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

0803 ;

摘要：

An interfacial force microscope(IFM) was employed to measure the inter-particle forces between two individual glass beads with diameters varying from 8 to 20 μm.With the feedback function of IFM turned off,attractive forces were obtained.The forces varied in the range of 0.1-0.34 μN,and their validity was confirmed by a theoretical analysis of the van der Waals force between the same glass beads.With the feedback function switched on,no attractive forces between particles were detected by the IFM when the probe approached the sample substrate.This may be attributed to the dramatic change of the attractive forces within a very short separation distance and/or the relatively poor signal-to-noise ratio of the IFM.

引用

页码：400 / 406

页数：7

共 8 条

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