Observation of fractal patterns on superconducting Bi2Sr2Ca1Cu2O7-x films on silicon by AFM

被引：0
作者：
QIAN Wensheng
机构：
来源：
Chinese Science Bulletin | 1997年 / 06期
关键词：
fractal; BSCCO; films;
D O I：
暂无
中图分类号：
O484 [薄膜物理学];
学科分类号：
080501 ; 1406 ;
摘要：
SUPERCONDUCTING BiSrCaCUO(BSCCO) films have been prepared in-situ on Si substrates with yttria stabilized zirconia (YSZ) buffer layers by rf magnetron sputtering. The superconducting BSCCO films have a critical temperature (T) of 82 K. Atomic force microscope (AFM) and transmission electron microscope (TEM) were used to image the surface morphology and microstructure of superconducting BSCCO films. Fractal patterns were ob
引用
收藏
页码：526 / 528
页数：3
相关论文
共 2 条
  • [1] Bian Bo,Yie Jian,Li Boquan et al.Fractal formation in α-Si: H/Ag/α-Si: H films after annealing, J. Applied Physics . 1993
  • [2] Raistrick,Ian D. Hawley,M. Beery,J. G. et al.Microstructure and growth mechanism of thin sputiered films of YBa2Cu3O7 on MgO substrates, Appl. Physics Letters . 1991
1