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X-RAY TOPOGRAPHIC OBSERVATION OF IMPERFECTION IN AT CUT SYNTHETIC QUARTZ PLATE
被引：0
作者：
郭常霖
黄月鸿
苏留焕
机构：
[1] ShanghaiInstituteofCeramics,AcademiaSinica,ShanghaiInstituteofCeramics,AcademiaSinica,ShanghaiInstituteofCeramics,AcademiaSinica
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X-RAY TOPOGRAPHIC OBSERVATION OF IMPERFECTION IN AT CUT SYNTHETIC QUARTZ PLATE;
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摘要：
<正> Ⅰ. INTRODUCTION Quartz has been widely used in radio industry, optical instruments and the like. It is used in manufacturing crystal filter, crystal oscillator, resonator, optical instrument and X-ray analyzer crystal. Lang, MeLaren and Takagi have conducted an X-ray topographic study of the defects of synthetic quartz. Most of the dislocation lines
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页码：424 / 429
页数：6
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