Design space of electrostatic chuck in etching chamber

被引:0
|
作者
孙钰淳 [1 ]
程嘉 [1 ]
路益嘉 [1 ]
侯悦民 [1 ]
季林红 [1 ]
机构
[1] State Key Laboratory of Tribology, Department of Mechanical Engineering, Tsinghua University
基金
中国国家自然科学基金;
关键词
design space; electrostatic chuck; clamping force; temperature control;
D O I
暂无
中图分类号
TN305.7 [光刻、掩膜];
学科分类号
摘要
One of the core semiconductor devices is the electrostatic chuck.It has been widely used in plasmabased and vacuum-based semiconductor processing.The electrostatic chuck plays an important role in adsorbing and cooling/heating wafers,and has technical advantages on non-edge exclusion,high reliability,wafer planarity,particles reduction and so on.This article extracts key design elements from the existing knowledge and techniques of electrostatic chuck by the method proposed by Paul and Beitz,and establishes a design space systematically.The design space is composed of working objects,working principles and working structures.The working objects involve electrostatic chuck components and materials,classifications,and relevant properties;the working principles involve clamping force,residual force,and temperature control;the working structures describe how to compose an electrostatic chuck and to fulfill the overall functions.The systematic design space exhibits the main issues during electrostatic chuck design.The design space will facilitate and inspire designers to improve the design quality and shorten the design time in the conceptual design.
引用
收藏
页码:98 / 104
页数:7
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