A Heavy Metal Analysis Device Based on Light-addressable Potentiometric Sensor

<正>A full automatic device to detect heavy metal Hg,Fe,Cr elements based on thin-film sensitive materials prepared on surface of light-addressable potentiometric sensors （LAPS） by means of pulsed laser deposition PLD) technique is developed. High-purity chemical compound AgI:Ag2S:HgI synthesized were used as target of PLD,thin film sensitive to Hg~ （2+） ion was prepared on the surface of LAPS.All-solide-state chalcogenide glass ion-selective electrodes ISE) ,Fe-ISE and Cr-ISE,were also used as targets of PLD,and thin-film sensors on different LAPS sensitive to Fe~ （3+） and Cr~ （6+） ions were prepared.The heavy metal analysis device with characteristics of collect sample in-site,real-time determination,communication and multifunction software were designed.Hardware design of the device mainly includes control and measurement aspects.The detected limits of Hg,Fe,Cr ions are 3.44×10~ （-7） mol/L,6.31×10~ （-6） mol/L and 2.09×10~ （-7） mol/L,respectively.