Measurement of the spatial coherence of hard synchrotron radiation using a pencil beam

被引：0

作者：

滑文强 ^{[1
]}

周光照 ^{[1
]}

王玉柱 ^{[1
]}

周平 ^{[1
]}

杨树敏 ^{[1
]}

彭川黔 ^{[2
]}

边风刚 ^{[1
]}

李秀宏 ^{[1
]}

王劼 ^{[1
]}

机构：

[1] Shanghai Institute of Applied Physics, Chinese Academy of Sciences

[2] School of Optoelectronic Information, Chongqing University of Technology

来源：

Chinese Optics Letters | 2017年 / 15卷 / 03期

关键词：

In; Measurement of the spatial coherence of hard synchrotron radiation using a pencil beam; length;

D O I：

暂无

中图分类号：

O434.1 [X射线];

学科分类号：

070207 ; 0803 ;

摘要：

We present a simple method to measure the spatial coherence of hard x-ray beams.Based on the convolution of Gaussian functions,we analyze the diffraction patterns of a grating irradiated by partially coherent hard x rays with a constrained beam diameter.The spatial coherence properties of an x-ray beam are obtained from the width of the diffraction peaks with high accuracy.The results of experiments conducted by combining a pinhole with a grating show a good agreement with our calculation using the Gaussian–Schell model.

引用

页码：105 / 109

页数：5

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