Effects of BaTiOand SrTiOas the buffer layers of epitaxial BiFeOthin films

被引：0
作者：
Yu Feng [1 ,2 ]
Can Wang [1 ,2 ]
ShiLu Tian [1 ,2 ]
Yong Zhou [1 ,2 ]
Chen Ge [1 ]
HaiZhong Guo [1 ]
Meng He [1 ]
KuiJuan Jin [1 ,2 ,3 ]
GuoZhen Yang [1 ,2 ,3 ]
机构：
[1] Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences
[2] University of Chinese Academy of Sciences
[3] Collaborative Innovation Center of Quantum Matter
来源：
Science China(Physics,Mechanics & Astronomy) | 2017年 / Mechanics & Astronomy)2017卷 / 06期
关键词：
BFO; buffer layer; strain;
D O I：
暂无
中图分类号：
O484 [薄膜物理学];
学科分类号：
080501 ; 1406 ;
摘要：
BiFeO3 （BFO） thin films with BaTiO3 （BTO） or SrTiO3 （STO） as buffer layer were epitaxially grown on SrRuO3-covered SrTiO3 substrates. X-ray diffraction measurements show that the BTO buffer causes tensile strain in the BFO films, whereas the STO buffer causes compressive strain. Different ferroelectric domain structures caused by these two strain statuses are revealed by piezoelectric force microscopy. Electrical and magnetical measurements show that the tensile-strained BFO/BTO samples have reduced leakage current and large ferroelectric polarization and magnetization, compared with compressively strained BFO/STO. These results demonstrate that the electrical and magnetical properties of BFO thin films can be artificially modified by using a buffer layer.
引用
收藏
页码：74 / 78
页数：5
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