Structural study of sputtered nanocrystalline Ti and Zr by X-ray diffraction

被引：0

作者：

SHI Wangzhou YAO Ruohe LIN Kuixun and LIN XuanyingDepartment of Physics Shantou University Shantou China ^{[515063
]}

机构：

来源：

关键词：

nanocrystalline Ti and Zr; structure; X-ray diffraction;

D O I：

暂无

中图分类号：

O434.1 [X射线];

学科分类号：

070207 ; 0803 ;

摘要：

<正> Ti and Zr are extensively used as gas absorbent for obtaining ultrahigh vacuum because of their

引用

页码：1880 / 1883

页数：4