X-ray scattering from liquid interfaces

被引：0
作者：
Mark L.SCHLOSSMAN
机构：
[1] DepartmentsofPhysicsandChemistryUniversityofIllinoisatChicago,WTaylorSt,Chicago,IL,USA
来源：
Nuclear Science and Techniques | 2006年 / 06期
关键词：
Liquid interfaces; X-ray scattering; Synchrotron radiation;
D O I：
暂无
中图分类号：
O434.1 [X射线];
学科分类号：
070207 ; 0803 ;
摘要：
<正>Synchrotron radiation X-ray scattering is a useful tool for structural characterization of liquid interfaces. Specular reflectivity provides precise measurement of the interfacial widths and of the ordering of surfactants adsorbed to these interfaces. Diffuse scattering gives information on phase transitions and domain formation in surfactant monolayers and on interfacial fluctuations confined by and coupled across fluidic films.
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收藏
页码：4+323 / 333 +323-333
页数：12
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