Raman spectroscopy characterization of two-dimensional materials

被引：0

作者：

梁芳 ^{[1
]}

徐何军 ^{[1
]}

吴幸 ^{[1
]}

王超伦 ^{[1
]}

骆晨 ^{[1
]}

张健 ^{[1
]}

机构：

[1] Shanghai Key Laboratory of Multidimensional Information Processing, Department of Electronic Engineering,East China Normal University

来源：

Chinese Physics B | 2018年 / 27卷 / 03期

基金：

中央高校基本科研业务费专项资金资助; 中国国家自然科学基金;

关键词：

Raman; MoS2; graphene; 2D materials; non-destructive characterization;

D O I：

暂无

中图分类号：

O433.5 [各类光谱];

学科分类号：

0703 ; 070302 ;

摘要：

Two-dimensional(2D) materials have become a hot study topic in recent years due to their outstanding electronic,optical, and thermal properties. The unique band structures of strong in-plane chemical bonds and weak out-of-plane van der Waals(vdW) interactions make 2D materials promising for nanodevices and various other applications. Raman spectroscopy is a powerful and non-destructive characterization tool to study the properties of 2D materials. In this work, we review the research on the characterization of 2D materials with Raman spectroscopy. In addition, we discuss the application of the Raman spectroscopy technique to semiconductors, superconductivity, photoelectricity, and thermoelectricity.

引用

页码：84 / 97

页数：14