Magnetic Field Effect in Scanning Tunneling Microscopy

被引：0
|
作者：
吴章华
王福熹
机构：
[1] Shanghai Institute of Optics and Fine Mechanics Academia Sinica Shanghai 201800 PRC
[2] Shanghai Institute of Optics and Fine Mechanics Academia Sinica Shanghai 201800 PRC
来源：
ChineseScienceBulletin | 1993年 / 23期
关键词：
magnetic effect; STM;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
1 Introduction Scanning tunneling microscopy (STM) attracts increasing interest in surface information research with atomic resolution. Since the pioneer work of G. Binnig and H. Rohrer, it has been developed rapidly in this field. Many new instruments have been invented such as atomic force microscopy (AFM), scanning tunneling potentiometry (STP), scanning near field optical microscopy (SNOM) and ballistic electron emission microscopy (BEEM).
引用
收藏
页码：1941 / 1943
页数：3
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