OBSERVATION OF DNA PARTIAL DENATURATION BY ATOMIC FORCE MICROSCOPY

被引：0
作者：
徐坚
机构：
[1] Beijing 100080
[2] China
[3] Chinese Academy of Sciences
[4] Institute of Chemistry
[5] State Key Laboratory of Polymer Physics and Chemistry
[6] The Center for Molecular Science
来源：
Chinese Journal of Polymer Science | 2004年 / 02期
基金：
中国国家自然科学基金;
关键词：
DNA; Denaturation; Extended-structure; AFM;
D O I：
暂无
中图分类号：
Q523 [脱氧核糖核酸（DNA）];
学科分类号：
071010 ; 081704 ;
摘要：
Atomic force microscopy was used to investigate the DNA-cetyltrimethylammonium bromide (CTAB) complexes adsorbed on highly ordered pyrolytic graphite (HOPG). These complexes, at low concentrations, can automatically spread out on the surface of HOPG. The DNA-CTAB complexes display a typically extended structure rather than a globular structure. Partially denaturated DNA produced by binding CTAB to DNA is directly observed by AFM with high resolution. The three-dimensional resolution of partially denaturated DNA obtained by AFM is not available by any other technique at present.
引用
收藏
页码：117 / 122
页数：6
相关论文
共 50 条
  • [41] Aggregation of gold nanoparticles and DNA damage by atomic force microscopy
    Shanzhou Hu
    Peng Liu
    Yu Hu
    Journal of Wuhan University of Technology-Mater. Sci. Ed., 2014, 29 : 180 - 184
  • [42] Atomic force microscopic observation of nucleosomes consisting of core histones and DNA promoter regions
    Takashima, Akira
    Sadamoto, Hisayo
    Okuta, Akiko
    Ito, Etsuro
    INFORMATION-AN INTERNATIONAL INTERDISCIPLINARY JOURNAL, 2008, 11 (04): : 513 - 523
  • [43] Study of DNA immobilization on mica surface by atomic force microscopy
    Veronika Horňáková
    Jan Přibyl
    Petr Skládal
    Monatshefte für Chemie - Chemical Monthly, 2016, 147 : 865 - 871
  • [44] Atomic force microscopy
    Musevic, I
    INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, 2000, 30 (04): : 223 - 227
  • [45] Visualization of the intermediates in a uniform DNA condensation system by tapping mode atomic force microscopy
    Liu, D
    Wang, C
    Lin, Z
    Li, JW
    Xu, B
    Wei, ZQ
    Wang, ZG
    Bai, CL
    SURFACE AND INTERFACE ANALYSIS, 2001, 32 (01) : 15 - 19
  • [46] Quantum dot binding to DNA: Single-molecule imaging with atomic force microscopy
    Li, Kungang
    Zhang, Wen
    Chen, Yongsheng
    BIOTECHNOLOGY JOURNAL, 2013, 8 (01) : 110 - +
  • [47] Chemical and thermal denaturation of crystalline bacterial S-Layer proteins: An atomic force microscopy study
    Toca-Herrera, JL
    Moreno-Flores, S
    Friedmann, J
    Pum, D
    Sleytr, UB
    MICROSCOPY RESEARCH AND TECHNIQUE, 2004, 65 (4-5) : 226 - 234
  • [48] Principles and Applications of Force Spectroscopy Using Atomic Force Microscopy
    Kim, Youngkyu
    Kim, Woong
    Park, Joon Won
    BULLETIN OF THE KOREAN CHEMICAL SOCIETY, 2016, 37 (12) : 1895 - 1907
  • [49] DNA at conductive interfaces: What can atomic force microscopy offer?
    Muzyka, Kateryna
    Rico, Felix
    Xu, Guobao
    Casuso, Ignacio
    JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 2023, 938
  • [50] Features of DNA-Montmorillonite Binding Visualized by Atomic Force Microscopy
    Kraevsky, Sergey V.
    Barinov, Nikolay A.
    Morozova, Olga V.
    Palyulin, Vladimir V.
    Kremleva, Alena V.
    Klinov, Dmitry V.
    INTERNATIONAL JOURNAL OF MOLECULAR SCIENCES, 2023, 24 (12)
12345