OBSERVATION OF DNA PARTIAL DENATURATION BY ATOMIC FORCE MICROSCOPY

被引：0
作者：
徐坚
机构：
[1] Beijing 100080
[2] China
[3] Chinese Academy of Sciences
[4] Institute of Chemistry
[5] State Key Laboratory of Polymer Physics and Chemistry
[6] The Center for Molecular Science
来源：
Chinese Journal of Polymer Science | 2004年 / 02期
基金：
中国国家自然科学基金;
关键词：
DNA; Denaturation; Extended-structure; AFM;
D O I：
暂无
中图分类号：
Q523 [脱氧核糖核酸（DNA）];
学科分类号：
071010 ; 081704 ;
摘要：
Atomic force microscopy was used to investigate the DNA-cetyltrimethylammonium bromide (CTAB) complexes adsorbed on highly ordered pyrolytic graphite (HOPG). These complexes, at low concentrations, can automatically spread out on the surface of HOPG. The DNA-CTAB complexes display a typically extended structure rather than a globular structure. Partially denaturated DNA produced by binding CTAB to DNA is directly observed by AFM with high resolution. The three-dimensional resolution of partially denaturated DNA obtained by AFM is not available by any other technique at present.
引用
收藏
页码：117 / 122
页数：6
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