Evaluation of Average Wall Thickness of Organically Modified Mesoporous Silica

被引：0
|
作者：
Yan Jun GONG1?
机构：
来源：
Chinese Chemical Letters | 2005年 / 01期
关键词：
Organically modified mesoporous silica; average wall thickness; small angle X-ray scattering (SAXS);
D O I：
暂无
中图分类号：
O613.72 [硅Si];
学科分类号：
摘要：
The small angle X-ray scattering of organically modified MSU-X silica prepared by co-condensation of tetraethoxysilane (TEOS) and methyltriethoxysilane (MTES) show negative deviation from Debye’s theory due to the existence of the organic interface layer. By exerting correction of the scattering negative deviation, Debye relation may be recovered, and the average wall thickness of the material may be evaluated.
引用
收藏
页码：139 / 142
页数：4
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