COMBINATORIAL DESIGN APPROACHES FOR AUTOMATIC TEST GENERATION

被引：0
|
作者：
Shi Liang Xu Baowen Nie Changhai (Dept of Computer Science & Eng.
机构：
来源：
Journal of Electronics(China) | 2005年 / 02期
关键词：
Software testing; n-way combination testing; Test case;
D O I：
暂无
中图分类号：
TP274.4 [];
学科分类号：
0804 ; 080401 ; 080402 ; 081002 ; 0835 ;
摘要：
The n-way combination testing is a specification-based testing criterion, which requires that for a system consisted of a few parameters, every combination of valid values of arbitrary n(n ≥ 2) parameters be covered by at least one test. This letter proposed two different test generation algorithms based on combinatorial design for the n-way coverage criterion. The automatic test generators are implemented and some valuable empirical results are obtained.
引用
收藏
页码：205 / 208
页数：4
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