The optimal thickness of a transmission-mode GaN photocathode
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作者:
王晓晖
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Science and Technology on Low-Light-Level Night Vision Laboratory
Institute of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and TechnologyScience and Technology on Low-Light-Level Night Vision Laboratory
王晓晖
[1
,2
]
石峰
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Science and Technology on Low-Light-Level Night Vision LaboratoryScience and Technology on Low-Light-Level Night Vision Laboratory
石峰
[1
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郭晖
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Science and Technology on Low-Light-Level Night Vision LaboratoryScience and Technology on Low-Light-Level Night Vision Laboratory
郭晖
[1
]
胡仓陆
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Science and Technology on Low-Light-Level Night Vision LaboratoryScience and Technology on Low-Light-Level Night Vision Laboratory
胡仓陆
[1
]
程宏昌
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Science and Technology on Low-Light-Level Night Vision LaboratoryScience and Technology on Low-Light-Level Night Vision Laboratory
程宏昌
[1
]
常本康
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Institute of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and TechnologyScience and Technology on Low-Light-Level Night Vision Laboratory
常本康
[2
]
任玲
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Institute of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and TechnologyScience and Technology on Low-Light-Level Night Vision Laboratory
任玲
[2
]
杜玉杰
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Institute of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and Technology
Department of Physics,Institute of BinzhouScience and Technology on Low-Light-Level Night Vision Laboratory
杜玉杰
[2
,3
]
张俊举
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Institute of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and TechnologyScience and Technology on Low-Light-Level Night Vision Laboratory
张俊举
[2
]
机构:
[1] Science and Technology on Low-Light-Level Night Vision Laboratory
[2] Institute of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and Technology
A 150-nm-thick GaN photocathode with a Mg doping concentration of 1.6×1017cm-3 is activated by Cs/O in an ultrahigh vacuum chamber,and a quantum efficiency(QE) curve of the negative electron affinity transmission-mode(t-mode) of the GaN photocathode is obtained.The maximum QE reaches 13.0% at 290 nm.According to the t-mode QE equation solved from the diffusion equation,the QE curve is fitted.From the fitting results,the electron escape probability is 0.32,the back-interface recombination velocity is 5×104 cm·s-1,and the electron diffusion length is 116 nm.Based on these parameters,the influence of GaN thickness on t-mode QE is simulated.The simulation shows that the optimal thickness of GaN is 90 nm,which is better than the 150-nm GaN.
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Univ Zagreb, Fac Elect Engn & Comp, Dept Wireless Commun, HR-10000 Zagreb, CroatiaUniv Zagreb, Fac Elect Engn & Comp, Dept Wireless Commun, HR-10000 Zagreb, Croatia
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Univ Michigan, Dept Elect Engn & Comp Sci, 1301 Beal Ave, Ann Arbor, MI 48109 USA
McGill Univ, Dept Elect & Comp Engn, 3480 Univ St, Montreal, PQ H3A 0E9, CanadaUniv Michigan, Dept Elect Engn & Comp Sci, 1301 Beal Ave, Ann Arbor, MI 48109 USA
Vanka, Srinivas
Arca, Elisabetta
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Natl Renewable Energy Lab, Golden, CO 80401 USAUniv Michigan, Dept Elect Engn & Comp Sci, 1301 Beal Ave, Ann Arbor, MI 48109 USA
Arca, Elisabetta
Cheng, Shaobo
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McMaster Univ, Dept Mat Sci & Engn, Canadian Ctr Electron Microscopy, 1280 Main St West, Hamilton, ON L8S 4M1, CanadaUniv Michigan, Dept Elect Engn & Comp Sci, 1301 Beal Ave, Ann Arbor, MI 48109 USA
Cheng, Shaobo
Sun, Kai
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Univ Michigan, Dept Mat Sci & Engn, 2300 Hayward St, Ann Arbor, MI 48109 USAUniv Michigan, Dept Elect Engn & Comp Sci, 1301 Beal Ave, Ann Arbor, MI 48109 USA
Sun, Kai
Botton, Gianluigi A.
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McMaster Univ, Dept Mat Sci & Engn, Canadian Ctr Electron Microscopy, 1280 Main St West, Hamilton, ON L8S 4M1, CanadaUniv Michigan, Dept Elect Engn & Comp Sci, 1301 Beal Ave, Ann Arbor, MI 48109 USA
Botton, Gianluigi A.
Teeter, Glenn
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Natl Renewable Energy Lab, Golden, CO 80401 USAUniv Michigan, Dept Elect Engn & Comp Sci, 1301 Beal Ave, Ann Arbor, MI 48109 USA
Teeter, Glenn
Mi, Zetian
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Univ Michigan, Dept Elect Engn & Comp Sci, 1301 Beal Ave, Ann Arbor, MI 48109 USAUniv Michigan, Dept Elect Engn & Comp Sci, 1301 Beal Ave, Ann Arbor, MI 48109 USA
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Institute of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and TechnologyInstitute of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and Technology
王晓晖
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高频
王洪刚
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Institute of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and TechnologyInstitute of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and Technology
王洪刚
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李飙
常本康
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Institute of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and TechnologyInstitute of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and Technology
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Department of Electronic Engineering, Nanjing University of Science and Technology, NanjingDepartment of Electronic Engineering, Nanjing University of Science and Technology, Nanjing
Guo X.
Wang X.
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Department of Electronic Engineering, Nanjing University of Science and Technology, NanjingDepartment of Electronic Engineering, Nanjing University of Science and Technology, Nanjing
Wang X.
Chang B.
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Department of Electronic Engineering, Nanjing University of Science and Technology, NanjingDepartment of Electronic Engineering, Nanjing University of Science and Technology, Nanjing
Chang B.
Zhang Y.
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Department of Electronic Engineering, Nanjing University of Science and Technology, NanjingDepartment of Electronic Engineering, Nanjing University of Science and Technology, Nanjing
Zhang Y.
Qiao J.
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Department of Electronic Engineering, Nanjing University of Science and Technology, NanjingDepartment of Electronic Engineering, Nanjing University of Science and Technology, Nanjing