基于相关拟合校准技术的MEMS平面微运动纳米精度测量

被引:4
作者
陈治
胡晓东
傅星
胡小唐
机构
[1] 天津大学精密测试技术及仪器国家重点实验室
关键词
计量学; MEMS谐振器; 动态特性; 相位相关; 亚像素;
D O I
暂无
中图分类号
TP21 [自动化元件、部件];
学科分类号
0804 ; 080401 ; 080402 ;
摘要
微电子机械系统(MEMS)谐振器周期运动过程中各个时刻的运动特性及其动态特性参数为MEMS器件的设计提供重要参考.提出一种基于相位相关技术的亚像素运动估计算法,可对相关拟合方法进行误差校准补偿,从而提高对物体运动的分辨力,实现纳米精度测量.利用该算法对MEMS器件的运动历程做分析,得到特定驱动频率下MEMS器件的幅度-相位曲线.利用扫频测量原理,获得了MEMS器件的幅频特性.实验结果表明,该方法具有较好的测量精度,测量分辨力优于5.nm.
引用
收藏
页码:549 / 553
页数:5
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