A high-linearity and high-resolution delay line structure with a calibration algorithm in delay-based LINC transmitters

被引：0

作者：

韩越 ^{[1
]}

乔树山 ^{[1
]}

黑勇 ^{[1
]}

机构：

[1] Institute of Microelectronics, Chinese Academy of Sciences

来源：

Journal of Semiconductors | 2016年 / 01期

关键词：

linear amplification with non-linear components(LINC); delay line; linearity; resolution;

D O I：

暂无

中图分类号：

TN838 [各种频率的发射机];

学科分类号：

摘要：

In order to overcome the bottleneck of low linearity and low resolution, an improved delay line structure is proposed with a calibration algorithm to conquer PVT(process, voltage and temperature) variations for an alldigital design. The chip is implemented in 0.13 m CMOS technology. Measurement results show that the proposed structure with the calibration algorithm can evidently improve the linearity and resolution of the delay line. The delay resolution is 2 ps and the root mean square jitter of the delay is 4.71 ps, leading to an error vector magnitude enhancement of 1.32 d B.

引用

页码：103 / 109

页数：7

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