Characterization of La-doped xBiInO3(1-x)PbTiO3 Piezoelectric Films Deposited by the Radio-Frequency Magnetron Sputtering Method

被引:0
|
作者
孙科学 [1 ]
张淑仪 [1 ]
Kiyotaka Wasa [1 ,2 ]
水修基 [1 ]
机构
[1] Laboratory of Modern Acoustics,Institute of Acoustics,Collaborative Innovation Center of Advanced Microstructures,Nanjing University
[2] Graduate School of Yokohama City University
基金
中国国家自然科学基金;
关键词
of; BI; Characterization of La-doped xBiInO3; x)PbTiO3 Piezoelectric Films Deposited by the Radio-Frequency Magnetron Sputtering Method; in; by; La; PT;
D O I
暂无
中图分类号
O484 [薄膜物理学];
学科分类号
080501 ; 1406 ;
摘要
La-doped and undoped xBHnO-(1-x)PbTiO(BI-PT) thin films are deposited on(101)SrRuO/(100)Pt/(100)MgO substrates by the rf-magnetron sputtering method.The structures of the films are characterized by XRD and SEM,and the results indicate that the thin films are grown with mainly(100) oriented and columnar structures.The ferroelectricity and piezoelectricity of the BI-PT Ghns are also measured,and the measured results illustrate that both performances are effectively improved by the La-doping with suitable concentrations.These results will open up wide potential applications of the flims in electronic devices.
引用
收藏
页码:53 / 56
页数:4
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