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Metrology 2025——the Grand Challenges for Metrology,APMP 2015 Held in Beijing
被引：0
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关键词：
APMP;
Metrology;
2025;
the Grand Challenges for Metrology;
APMP 2015 Held in Beijing;
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中图分类号：
F203 [生产行业管理];
学科分类号：
020201 ;
摘要：
Sponsored by the National Institute of Metrology,China(NIM),the International Workshop on"Metrology2025-the Grand Challenges for Metrology"was held in Beijing on November 4 as one of the highlights of the General Assembly 2015 of Asia Pacific Metrology Program(APMP).The event welcomed a total of400 participants,including representatives from international and regional
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