Thermal-Mechanical Simulation and Analysis on Structural Caused Package Induced Stress in Stacked Chip Scale Package附视频

被引:0
作者
钱峰
程秀兰
刘恩峰
机构
[1] SchoolofMicroelectronic,ShanghaiJiaotongUniv
关键词
stack chip scale package(SCSP); package induced stress; structural factor;
D O I
10.16183/j.cnki.jsjtu.2007.s2.033
中图分类号
TN405 [制造工艺];
学科分类号
摘要
Stacked chip scale package(SCSP) attracts more and more attentions in advanced packages application with light weight,thin and small size,high reliability,low power and high storage capability.However,more and more physical and electrical issues being caused by package-induced stress in SCSP were reported recently.The effect of structural factors,including die thickness,die attach film thickness,die attach film type,and spacer size on package induced stress,was investigated.Analyses were given based on simulation results and provide important suggestion for package design.
引用
收藏
页码:139 / 143
页数:5
相关论文
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[1]  
Acomprehensive approach for the analy-sis of package induced stress in IC’s using analyticaland empirical methods .2 Pendse R D. IEEE Transactions on Com-ponents,Hybrids,and Manufacturing Technology . 1991