An　Approach　to　the　Fault　Diagnosis　and　Testability　in　Analog　Circuits　at　Module　Level

被引：0
|
作者：
Yang Jiawei (Beijing Institute of Remote Sensing Equipment
and Tong.Shibai(Department of Automation
机构：
来源：
Chinese Journal of Systems Engineering and Electronics | 1994年 / 02期
关键词：
Fault diagnosis; Module; Testability; Topological condition. Independent path;
D O I：
暂无
中图分类号：
N945 [系统工程];
学科分类号：
071102 ;
摘要：
ＡｎＡｐｐｒｏａｃｈｔｏｔｈｅＦａｕｌｔＤｉａｇｎｏｓｉｓａｎｄＴｅｓｔａｂｉｌｉｔｙｉｎＡｎａｌｏｇＣｉｒｃｕｉｔｓａｔＭｏｄｕｌｅＬｅｖｅｌＹａｎｇＪｉａｗｅｉ（ＢｅｉｊｉｎｇＩｎｓｔｉｔｕｔｅｏｆＲｅｍｏｔｅＳｅｎｓｉｎｇＥｑｕｉｐｍｅｎｔ，Ｂ...
引用
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页码：26 / 40
页数：15
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