Light-emission Properties Of Europium-doped tantalum-oxide thin films deposited by radio-frequency magnetron sputtering

被引：6

作者：

Miura, Kenta ^{[1
]}

Arai, Yuki ^{[1
]}

Osawa, Takumi ^{[1
]}

Hanaizumi, Osamu ^{[1
]}

机构：

[1] Department of Electronic Engeneering, Graduate School of Engeneering, Gamma University, Japan

来源：

Journal of Light and Visual Environment | 2012年 / 36卷 / 02期

关键词：

Annealing - Ultraviolet lasers - Light emission - Europium compounds - Radio waves - Thin films - Magnetron sputtering - Oxide films;

D O I：

10.2150/jlve.36.64

中图分类号：

学科分类号：

摘要：

Light-emitting europium-doped tantalum-oxide thin films were prepared by radio-frequency magnetron sputtering. Red photoluminescence was obtained from the films after annealing by ultraviolet-laser excitation. Four peaks having wavelengths of around 600, 620, 650, and 700 nm were observed from films annealed at 600 to 900°C. The strongest intensity of the most remarkable 620-nm peak was obtained from the film annealed at 700°C for 20 min.

引用

页码：64 / 67