Context-aware stacked convolutional neural networks for classification of breast carcinomas in whole-slide histopathology images

被引:127
作者
Bejnordi B.E. [1 ]
Zuidhof G. [2 ]
Balkenhol M. [2 ]
Hermsen M. [2 ]
Bult P. [2 ]
Van Ginneken B. [1 ]
Karssemeijer N. [1 ]
Litjens G. [1 ,2 ]
Van Der Laak J. [1 ,2 ]
机构
[1] Radboud University Medical Center, Diagnostic Image Analysis Group, Department of Radiology and Nuclear Medicine, Nijmegen
[2] Radboud University Medical Center, Diagnostic Image Analysis Group, Department of Pathology, Nijmegen
关键词
breast cancer; context-aware CNN; convolutional neural networks; deep learning; histopathology;
D O I
10.1117/1.JMI.4.4.044504
中图分类号
学科分类号
摘要
Currently, histopathological tissue examination by a pathologist represents the gold standard for breast lesion diagnostics. Automated classification of histopathological whole-slide images (WSIs) is challenging owing to the wide range of appearances of benign lesions and the visual similarity of ductal carcinoma in-situ (DCIS) to invasive lesions at the cellular level. Consequently, analysis of tissue at high resolutions with a large contextual area is necessary. We present context-aware stacked convolutional neural networks (CNN) for classification of breast WSIs into normal/benign, DCIS, and invasive ductal carcinoma (IDC). We first train a CNN using high pixel resolution to capture cellular level information. The feature responses generated by this model are then fed as input to a second CNN, stacked on top of the first. Training of this stacked architecture with large input patches enables learning of fine-grained (cellular) details and global tissue structures. Our system is trained and evaluated on a dataset containing 221 WSIs of hematoxylin and eosin stained breast tissue specimens. The system achieves an AUC of 0.962 for the binary classification of nonmalignant and malignant slides and obtains a three-class accuracy of 81.3% for classification of WSIs into normal/benign, DCIS, and IDC, demonstrating its potential for routine diagnostics. © 2017 Society of Photo-Optical Instrumentation Engineers (SPIE).
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