Finding common ground for MEMS standards

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作者：

Lightman, Karen ^{[1
]}

机构：

[1] MEMS Industry Group, United States

来源：

Electronic Products | 2012年 / 54卷 / 11期

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摘要：

Several suppliers and users of electronic devices presented their conflicting views during the panels of the MEMS track at 2012 Sensors Expo. Steve Whalley, director for Sensors at Intel's Architecture Group, would like to see MEMS products adhere to common guidelines on how parameters are tested, validated, calibrated and, ultimately, specified in data sheets. Jeannette Wilson, product line manager for Consumer and Industrial Sensors at Freescale Semiconductor, would like standards for measuring and specifying algorithm performance. Rob O'Reilly, senior member of the technical staff in the MEMS and Sensors Technology Group at Analog Devices, said that it will start with parameters such as offset, sensitivity, and output protocols, and added that there is already momentum around the latter as well as operating voltage, FIFO structure, and data rates. As MEMS takes on more diverse applications, Dell's Clardy clarified the broader environment that success brings in dealing with supply-chain management.

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