Research on the Humidity Resistance Reliability of Different Packaging Structures

被引:1
作者
Xuan, Hui [1 ]
Yu, Zheng [1 ]
Wu, Hua [1 ]
Ding, Wanchun [1 ]
Gao, Guohua [1 ]
机构
[1] Tongfu Microelect Co Ltd, Nantong, Peoples R China
来源
2021 22ND INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, ICEPT | 2021年
关键词
packaging structure; humidity resistance; reliability; electronic components;
D O I
10.1109/ICEPT52650.2021.9567979
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Packaging process is an indispensable part in the process of electronic components manufacturing, and its packaging quality directly affects the nominal power, reliability and other functions of the product in the subsequent application process. Through the research on the humidity resistance reliability of different packaging structures, C-Mount packaging structure, TO packaging structure and butterfly packaging structure, three common packaging structures are introduced and analyzed first, and then studied the humidity resistance reliability of different packaging structures by analyzing the high and low temperature and temperature cycle reliability of different packaging structures and the thermal characteristics of different packaging structures in different humidity environments research. The results show that the butterfly package structure has the best humidity resistance reliability followed by TO package structure and C-Mount package structure was the worst.
引用
收藏
页数:4
相关论文
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