Lifetime prediction of electrical connectors under multiple environment stresses of temperature and particulate contamination

被引：6

作者：

Qingya L. ^{[1
,3
]}

Jinchun G. ^{[1
,3
]}

Gang X. ^{[2
,3
]}

Qiuyan J. ^{[1
,3
]}

Rui J. ^{[1
,3
]}

机构：

[1] School of Electronic Engineering, Beijing University of Posts and Telecommunications, Beijing

[2] School of Information and Communication Engineering, Beijing University of Posts and Telecommunications, Beijing

[3] Beijing Key laboratory of Work Safety Intelligent Monitoring, Beijing University of Posts and Telecommunications, Beijing

来源：

Journal of China Universities of Posts and Telecommunications | 2016年 / 23卷 / 05期

关键词：

accelerated lifetime testing; electrical connectors; lifetime prediction;

D O I：

10.1016/S1005-8885(16)60059-6

中图分类号：

TN6 [电子元件、组件];

学科分类号：

080903 ;

摘要：

Electrical connectors play a significant role in the electronic and communication systems. As they are often exposed in the atmosphere environment, it is extremely easy for them to cause electrical contact failure. It is essential to carry out the reliability modeling and predict the lifetime. In the present work, the accelerated lifetime testing method which is on account of the uniform design method was designed to obtain the degradation data under multiple environmental stresses of temperature and particulate contamination for electrical connectors. Based on the degradation data, the pseudo life can be acquired. Then the reliability model was established by analyzing the pseudo life. Accordingly, the reliability function and reliable lifetime function were set up, and the reliable lifetime of the connectors under the multiple environment stresses of temperature and particulate contamination could be predicted for electrical connectors. © 2016 The Journal of China Universities of Posts and Telecommunications

引用

页码：61,81 / 67

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