Storage degradation testing and life prediction for missile electromagnetic relay

被引：0
作者：
Wang Z. [1 ,2 ]
Fu S. [1 ]
Shang S. [1 ]
Zhai G. [3 ]
机构：
[1] School of Electronics and Information, Jiangsu University of Science and Technology, Zhenjiang
[2] Postdoctoral Research Station of Mechanical Engineering, Zhejiang Sci-Tech University, Hangzhou
[3] School of Electrical Engineering and Automation, Harbin Institute of Technology, Harbin
来源：
Beijing Hangkong Hangtian Daxue Xuebao/Journal of Beijing University of Aeronautics and Astronautics | 2016年 / 42卷 / 12期
基金：
中国国家自然科学基金; 中国博士后科学基金;
关键词：
Autoregressive moving average (ARMA) model; Contact resistance; Degradation testing; Electromagnetic relay (EMR); Life prediction; Storage reliability; Wavelet transform;
D O I：
10.13700/j.bh.1001-5965.2015.0789
中图分类号：
学科分类号：
摘要：
Missile electromagnetic relay (EMR) is one of the key electromechanical components used for signal transmission, load switching and circuit protection in defense weapon system. How to reliably evaluate the storage reliability of missile EMR has become the most important problem that is urgent to be solved. This study used missile EMR as research object. A new method for testing storage reliability is proposed by performance parameters degradation. The test and analysis system of missile EMR storage parameters was designed and developed. Based on the analysis of parameters changing in storage degradation testing, the modeling storage reliability method of missile EMR is extensively investigated. Prediction parameters preprocessing method is proposed which is based on time series analysis with wavelet transform method. And in this way, the prediction accuracy is increased. Parameters of the storage degradation model are estimated through the regression theory, and the storage life of missile EMR under normal stress is predicted. © 2016, Editorial Board of JBUAA. All right reserved.
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收藏
页码：2610 / 2619
页数：9
相关论文
共 18 条
[1]  
Guo F.Y., Chen Z.H., Electrical Contacts Theory Applications and Technology, pp. 1-18, (2008)
[2]  
Shang A.C., Military sealed relays non-work storage reliability research, Proceedings of the 8th National Reliability Physical Seminar, pp. 263-270, (1999)
[3]  
Lu J.G., Luo Y.Y., Li W.H., Et al., Storage life test and failure analysis of aerospace relays, Transactions of China Electrotechnical Society, 24, 2, pp. 54-59, (2009)
[4]  
Chen Z.H., Zheng S.R., Lifetime distribution based degradation analysis, IEEE Transactions on Reliability, 54, 1, pp. 3-10, (2005)
[5]  
Neuhaus A.R., Rieder W.F., Hammerschmidt M., Influence of electrical and mechanical parameters on contact welding in low power switches, IEEE Transactions on Components and Packaging Technologies, 27, 1, pp. 4-11, (2004)
[6]  
Chen Z.K., Witter G., Dynamic welding of silver contacts under different mechanical bounce conditions, Proceedings of the 45th IEEE Holm Conference on Electrical Contacts, pp. 1-8, (1999)
[7]  
Mcrbride J.W., Sharkh S.M., Electrical contact phenomena during impact, IEEE Transactions on Components Hybrids, Manufacture Technologies, 15, 1, pp. 184-192, (1992)
[8]  
Rieder W.F., Neuhaus A.R., Short arc modes determining both contact welding and material transfer, IEEE Transactions on Components and Packaging Technologies, 30, 1, pp. 9-14, (2007)
[9]  
Chen Z.K., Witter G., Comparison in performance for silver-tin-indium oxide materials made by internal oxidation and power metallurgy, Proceedings of the 55th IEEE Holm Conference on Electrical Contacts, pp. 180-186, (2009)
[10]  
Tamai T., Effect of humidity on growth of oxide film on surface of copper contacts, IEICE Transactions on Electron, E90-C, 7, pp. 1391-1397, (2007)
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