A Comprehensive Review on Physical Unclonable Functions Based on Resistive Random Access Memory

被引:0
作者
Zahoor, Furqan [1 ]
Bature, Usman Isyaku [2 ,3 ]
Nisar, Arshid [4 ]
Alzahrani, Ali [1 ]
Abbas, Haider [5 ]
Bashir, Faisal [1 ]
机构
[1] King Faisal Univ, Coll Comp Sci & Informat Technol, Dept Comp Engn, Al Hasa 31982, Saudi Arabia
[2] Abubakar Tafawa Balewa Univ ATBU, Dept Comp & Commun Engn, Bauchi 740272, Nigeria
[3] Univ Teknol Petronas, Dept Elect & Elect Engn, Seri Iskandar 32610, Perak, Malaysia
[4] Indian Inst Technol, Dept Elect & Commun Engn, Roorkee 247667, India
[5] Sejong Univ, Dept Nanotechnol & Adv Mat Engn, Seoul 143747, South Korea
关键词
PUF; RRAM; Hardware Security; AI; Entropy; SIDE-CHANNEL; PUF DESIGN; AUTHENTICATION; HARDWARE; DEVICE; SECURE; THRESHOLD; CIRCUIT; SYSTEM; ARRAYS;
D O I
10.1021/acsaelm.5c00504
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Chip authentication and secure communication have become crucial due to the increasing use of mobile computing and the Internet of Things (IoT). Hardware-based security concepts typically offer optimum performance in terms of a high level of security, low power consumption, and large-area density. Hardware security becomes much more crucial in order to safeguard the enormous volumes of private information sensitive data stored on edge devices. Physical unclonable functions (PUFs) are becoming more and more popular as hardware security primitives because they can create truly random digital keys by taking advantage of the intrinsic randomness in the device. Among the most promising options for delivering the necessary hardware security features at a very low area-energy-runtime budget are emerging nonvolatile memory technologies. Among the emerging nonvolatile memory devices, the performance of resistive random access memory (RRAM) stands out primarily owing to its high-density integration. RRAM has received significant attention from both industry and academia, as it is considered suitable for implementing beyond Von Neumann architectures. Additionally, RRAM offers fluctuations in switching resistances, random telegraph noise, and sneak path current that make them suitable for designing security hardware such as PUFs. This paper provides a background on the basics of PUFs, and then presents in detail the protocols, functionality, and methodologies proposed in the PUFs based on RRAM. Finally, the future outlook for PUFs based on RRAM is presented in this review.
引用
收藏
页码:6215 / 6242
页数:28
相关论文
共 212 条
[1]   The coexistence of threshold and memory switching characteristics of ALD HfO2memristor synaptic arrays for energy-efficient neuromorphic computing [J].
Abbas, Haider ;
Abbas, Yawar ;
Hassan, Gul ;
Sokolov, Andrey Sergeevich ;
Jeon, Yu-Rim ;
Ku, Boncheol ;
Kang, Chi Jung ;
Choi, Changhwan .
NANOSCALE, 2020, 12 (26) :14120-14134
[2]   Resistive switching characteristics of manganese oxide thin film and nanoparticle assembly hybrid devices [J].
Abbas, Haider ;
Park, Mi Ra ;
Abbas, Yawar ;
Hu, Quanli ;
Kang, Tae Su ;
Yoon, Tae-Sik ;
Kang, Chi Jung .
JAPANESE JOURNAL OF APPLIED PHYSICS, 2018, 57 (06)
[3]   Survey of Emerging Technology Based Physical Unclonable Funtions [J].
Adames, Ilia A. Bautista ;
Das, Jayita ;
Bhanja, Sanjukta .
2016 INTERNATIONAL GREAT LAKES SYMPOSIUM ON VLSI (GLSVLSI), 2016, :317-322
[4]   Physical Unclonable Functions (PUF) for IoT Devices [J].
Al-Meer, Abdulaziz ;
Al-Kuwari, Saif .
ACM COMPUTING SURVEYS, 2023, 55 (14S)
[5]   Threshold Voltage based Dual Memristor Crossbar PUF [J].
Al-Tamimi, Aref ;
Ali, Shawkat ;
Cao, Yuan ;
Bermak, Amine .
AEU-INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATIONS, 2024, 175
[6]   Survey of Stochastic Computing [J].
Alaghi, Armin ;
Hayes, John P. .
ACM TRANSACTIONS ON EMBEDDED COMPUTING SYSTEMS, 2013, 12
[7]   Fortifying Strong PUFs: A Modeling Attack-Resilient Approach Using Weak PUF for IoT Device Security [J].
Alahmadi, Sara ;
Khalil, Kasem ;
Idriss, Haytham ;
Bayoumi, Magdy .
2024 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, ISCAS 2024, 2024,
[8]  
Anderson JH, 2010, ASIA S PACIF DES AUT, P1, DOI 10.1109/ASPDAC.2010.5419927
[9]   Testing and reliability enhancement of security primitives: Methodology and experimental validation [J].
Anik, Toufiq Hasan ;
Danger, Jean-L ;
Diankha, Omar ;
Ebrahimabadi, Mohammad ;
Frisch, Christoph ;
Guilley, Sylvain ;
Karimi, Naghmeh ;
Pehl, Michael ;
Takarabt, Sofiane .
MICROELECTRONICS RELIABILITY, 2023, 147
[10]   Testing and Reliability Enhancement of Security Primitives [J].
Anik, Toufiq Hasan ;
Danger, Jean-Luc ;
Diankha, Omar ;
Ebrahimabadi, Mohammad ;
Frisch, Christoph ;
Guilley, Sylvain ;
Karimi, Naghmeh ;
Pehl, Michael ;
Takarabt, Sofiane .
34TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFT 2021), 2021,