Junction Temperature Monitoring of Power Devices Using Convolutional Neural Networks

被引:0
作者
Xu, Zhiliang [1 ]
Wang, Huimin [1 ]
Ge, Xinglai [1 ]
Zhang, Yichi [3 ]
Xie, Dong [2 ]
Yao, Bo [3 ]
Zhang, Linlin [1 ]
Wang, Yi [1 ]
Feng, Xiaoyun [1 ]
机构
[1] Southwest Jiaotong Univ, Key Lab Magnet Suspens Technol & Maglev Vehicle, Minist Educ, Chengdu 610031, Peoples R China
[2] Southwest Jiaotong Univ, Sch Integrated Circuits Sci & Engn, Chengdu 611756, Peoples R China
[3] Aalborg Univ, Dept Energy Technol, DK-9220 Aalborg, Denmark
基金
中国国家自然科学基金;
关键词
Temperature measurement; Logic gates; Aging; Insulated gate bipolar transistors; Voltage measurement; Temperature sensors; Junctions; Convolutional neural networks; Current measurement; Accuracy; Convolutional neural network; device aging; junction temperature monitoring; load current; power device; ELECTRICAL PARAMETERS; VOLTAGE;
D O I
10.1109/TIA.2025.3549389
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The temperature-sensitive electrical parameter (TSEP) -based method enables accurate junction temperature monitoring (JTM) of power devices. However, the majority of TSEPs are susceptible to errors due to the effects of load currents and device aging, reducing the accuracy of JTM. To address this, a JTM method based on a convolutional neural network (CNN) model is proposed to deal with the unfavorable effects of two factors. In this method, the turn-on collector current (I-C) is selected as the TSEP, and the temperature characteristics of the turn-on I-C are thoroughly analyzed by a mathematical model. Moreover, the parameter dependence of the turn-on I-C is fully investigated with extensive double-pulse tests. Then, considering the significant effect and the frequent variations of load current in practice, the adverse effects of load current are mitigated based on the CNN. Finally, experimental verification is given to prove the effectiveness and accuracy of the proposed model based on a single-phase rectifier.
引用
收藏
页码:6632 / 6643
页数:12
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