Ultrawide Bandgap Channel Polarization-Doped Junction Field-Effect Transistor

被引:0
作者
Ramesh, Madhav [1 ]
Agrawal, Shivali [2 ]
Xing, Huili Grace [1 ,3 ]
Jena, Debdeep [1 ,3 ]
机构
[1] Cornell Univ, Sch Elect & Comp Engn, Ithaca, NY 14853 USA
[2] Cornell Univ, Dept Chem & Biomol Engn, Ithaca, NY 14853 USA
[3] Cornell Univ, Dept Mat Sci & Engn, Ithaca, NY 14853 USA
来源
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2025年
关键词
distributed polarization doping; junction field-effect transistors; ultrawide bandgap AlGaN;
D O I
10.1002/pssa.202401023
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An ultrawide bandgap (UWBG) AlGaN channel polarization-doped junction field-effect transistor (POLJFET) grown by molecular beam epitaxy on a bulk AlN substrate is presented. The POLJFET leverages distributed polarization doping for the p-side gate, owing to the challenges associated with reliable acceptor impurity doping in UWBG AlGaN. Successful gate control of the transistor channel by pn junction field effect, with a threshold voltage of approximate to-30 V, is demonstrated. The transistor shows a significantly low OFF current (<10 nA mm(-1)) while the ON current is 0.03 mA mm(-1), primarily limited by the high contact resistivity of the n-type AlGaN channel. This is expected due to the low doping of n-AlGaN by design and can be mitigated by contact optimization techniques (either by regrowth or ion implantation) in future iterations.
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页数:4
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