An Empirical Analysis on Just-In-Time Defect Prediction Models for Self-driving Software Systems

被引:0
作者
Choi, Jiwon [1 ]
Manikandan, Saranya [1 ]
Ryu, Duksan [1 ]
Baik, Jongmoon [2 ]
机构
[1] Jeonbuk Natl Univ, Dept Software Engn, Jeonju, South Korea
[2] Korea Adv Inst Sci & Technol, Sch Comp, Daejeon, South Korea
来源
CURRENT TRENDS IN WEB ENGINEERING, ICWE 2022 INTERNATIONAL WORKSHOPS | 2023年 / 1668卷
基金
新加坡国家研究基金会;
关键词
Just-in-time defect prediction; Change-metric; Machine learning; Explainable AI;
D O I
暂无
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Just-in-time (JIT) defect prediction has been used to predict whether a code change is defective or not. Existing JIT prediction has been applied to different kind of open-source software platform for cloud computing, but JIT defect prediction has never been applied in self-driving software. Unlike other software systems, self-driving system is an AI-enabled system and is a representative system to which edge cloud service is applied. Therefore, we aim to identify whether the existing JIT defect prediction models for traditional software systems also work well for self-driving software. To this end, we collect and label the dataset of open-source self-driving software project using SZZ (Sliwerski, Zimmermann and Zeller) algorithm. And we select four traditional machine learning methods and state-of-the-art research (i.e., JIT-Line) as our baselines and compare their prediction performance. Our experimental results show that JITLine and logistic regression produce superior performance, however, there exists a room to be improved. Through XAI (Explainable AI) analysis it turned out that the prediction performance is mainly affected by experience and history-related features among change-level metrics. Our study is expected to provide important insight for practitioners and subsequent researchers performing defect prediction in AI-enabled system.
引用
收藏
页码:34 / 45
页数:12
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