共 33 条
[31]
Characterization of various Sn targets with respect to debris and fast ion generation
[J].
Ueno, Yoshifumi
;
Hoshino, Hideo
;
Ariga, Tatsuya
;
Miura, Taisuke
;
Nakano, Masaki
;
Komori, Hiroshi
;
Soumagne, Georg
;
Endo, Akira
;
Mizoguchi, Hakaru
;
Sumitani, Akira
;
Toyoda, Koichi
.
EMERGING LITHOGRAPHIC TECHNOLOGIES XI, PTS 1 AND 2,
2007, 6517

Ueno, Yoshifumi
论文数: 0 引用数: 0
h-index: 0
机构:
Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan

Hoshino, Hideo
论文数: 0 引用数: 0
h-index: 0
机构:
Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan

Ariga, Tatsuya
论文数: 0 引用数: 0
h-index: 0
机构:
Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan

Miura, Taisuke
论文数: 0 引用数: 0
h-index: 0
机构:
Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan

Nakano, Masaki
论文数: 0 引用数: 0
h-index: 0
机构:
Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan

Komori, Hiroshi
论文数: 0 引用数: 0
h-index: 0
机构:
Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan

Soumagne, Georg
论文数: 0 引用数: 0
h-index: 0
机构:
Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan

Endo, Akira
论文数: 0 引用数: 0
h-index: 0
机构:
Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan

Mizoguchi, Hakaru
论文数: 0 引用数: 0
h-index: 0
机构:
Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan

Sumitani, Akira
论文数: 0 引用数: 0
h-index: 0
机构:
Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan

Toyoda, Koichi
论文数: 0 引用数: 0
h-index: 0
机构:
Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan Extreme Ultraviolet Lithography Syst Dev Assoc, EUVA, 1200 Manda Hiratsuka, Kanagawa 2548567, Japan
[32]
Enabling sub-10nm node lithography: presenting the NXE:3400B EUV scanner
[J].
van de Kerkhof, Mark
;
Jasper, Hans
;
Levasier, Leon
;
Peeters, Rudy
;
van Es, Roderik
;
Bosker, Jan-Willem
;
Zdravkov, Alexander
;
Lenderink, Egbert
;
Evangelista, Fabrizio
;
Broman, Par
;
Bilski, Bartosz
;
Last, Thorsten
.
EXTREME ULTRAVIOLET (EUV) LITHOGRAPHY VIII,
2017, 10143

van de Kerkhof, Mark
论文数: 0 引用数: 0
h-index: 0
机构:
ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands

Jasper, Hans
论文数: 0 引用数: 0
h-index: 0
机构:
ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands

Levasier, Leon
论文数: 0 引用数: 0
h-index: 0
机构:
ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands

Peeters, Rudy
论文数: 0 引用数: 0
h-index: 0
机构:
ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands

van Es, Roderik
论文数: 0 引用数: 0
h-index: 0
机构:
ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands

Bosker, Jan-Willem
论文数: 0 引用数: 0
h-index: 0
机构:
ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands

Zdravkov, Alexander
论文数: 0 引用数: 0
h-index: 0
机构:
ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands

Lenderink, Egbert
论文数: 0 引用数: 0
h-index: 0
机构:
ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands

Evangelista, Fabrizio
论文数: 0 引用数: 0
h-index: 0
机构:
ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands

Broman, Par
论文数: 0 引用数: 0
h-index: 0
机构:
ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands

Bilski, Bartosz
论文数: 0 引用数: 0
h-index: 0
机构:
ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands

Last, Thorsten
论文数: 0 引用数: 0
h-index: 0
机构:
ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands ASML Netherlands BV, De Run 6501, NL-5504 DR Veldhoven, Netherlands
[33]
Characterization and optimization of tin particle mitigation and EUV conversion efficiency in a laser produced plasma EUV light source
[J].
Yanagida, Tatsuya
;
Nagano, Hitoshi
;
Wada, Yasunori
;
Yabu, Takayuki
;
Nagai, Shinji
;
Soumagne, Georg
;
Hori, Tsukasa
;
Kakizaki, Kouji
;
Sumitani, Akira
;
Fujimoto, Junichi
;
Mizoguchi, Hakaru
;
Endo, Akira
.
EXTREME ULTRAVIOLET (EUV) LITHOGRAPHY II,
2011, 7969

Yanagida, Tatsuya
论文数: 0 引用数: 0
h-index: 0
机构:
EUVA, 3-25-1 Shinomiya Hiratsuka, Kanagawa 2548555, Japan EUVA, 3-25-1 Shinomiya Hiratsuka, Kanagawa 2548555, Japan

Nagano, Hitoshi
论文数: 0 引用数: 0
h-index: 0
机构:
KOMATSU Ltd, Hiratsuka, Kanagawa 2548555, Japan EUVA, 3-25-1 Shinomiya Hiratsuka, Kanagawa 2548555, Japan

Wada, Yasunori
论文数: 0 引用数: 0
h-index: 0
机构:
EUVA, 3-25-1 Shinomiya Hiratsuka, Kanagawa 2548555, Japan EUVA, 3-25-1 Shinomiya Hiratsuka, Kanagawa 2548555, Japan

Yabu, Takayuki
论文数: 0 引用数: 0
h-index: 0
机构:
EUVA, 3-25-1 Shinomiya Hiratsuka, Kanagawa 2548555, Japan EUVA, 3-25-1 Shinomiya Hiratsuka, Kanagawa 2548555, Japan

Nagai, Shinji
论文数: 0 引用数: 0
h-index: 0
机构:
EUVA, 3-25-1 Shinomiya Hiratsuka, Kanagawa 2548555, Japan EUVA, 3-25-1 Shinomiya Hiratsuka, Kanagawa 2548555, Japan

Soumagne, Georg
论文数: 0 引用数: 0
h-index: 0
机构:
EUVA, 3-25-1 Shinomiya Hiratsuka, Kanagawa 2548555, Japan EUVA, 3-25-1 Shinomiya Hiratsuka, Kanagawa 2548555, Japan

Hori, Tsukasa
论文数: 0 引用数: 0
h-index: 0
机构:
EUVA, 3-25-1 Shinomiya Hiratsuka, Kanagawa 2548555, Japan EUVA, 3-25-1 Shinomiya Hiratsuka, Kanagawa 2548555, Japan

Kakizaki, Kouji
论文数: 0 引用数: 0
h-index: 0
机构:
KOMATSU Ltd, Hiratsuka, Kanagawa 2548555, Japan EUVA, 3-25-1 Shinomiya Hiratsuka, Kanagawa 2548555, Japan

Sumitani, Akira
论文数: 0 引用数: 0
h-index: 0
机构:
EUVA, 3-25-1 Shinomiya Hiratsuka, Kanagawa 2548555, Japan EUVA, 3-25-1 Shinomiya Hiratsuka, Kanagawa 2548555, Japan

Fujimoto, Junichi
论文数: 0 引用数: 0
h-index: 0
机构:
Gigaphoton Inc, Oyama 3238558, Japan EUVA, 3-25-1 Shinomiya Hiratsuka, Kanagawa 2548555, Japan

Mizoguchi, Hakaru
论文数: 0 引用数: 0
h-index: 0
机构:
Gigaphoton Inc, Oyama 3238558, Japan EUVA, 3-25-1 Shinomiya Hiratsuka, Kanagawa 2548555, Japan

Endo, Akira
论文数: 0 引用数: 0
h-index: 0
机构:
Forschungzentrum Dresden, Dresden, Germany EUVA, 3-25-1 Shinomiya Hiratsuka, Kanagawa 2548555, Japan