Numerical study of the magnetohydrodynamic properties of laser-produced tin plasma under external magnetic field

被引:0
作者
Ren, Can [1 ]
Yuan, Yun [2 ]
Sun, Wei [1 ]
Wang, Zhao [1 ]
机构
[1] China Inst Atom Energy, Dept Nucl Phys, POB 275 7, Beijing 102413, Peoples R China
[2] Univ South China, Sch Nucl Sci & Technol, Hengyang 421001, Peoples R China
基金
中国国家自然科学基金;
关键词
laser plasma; magnetohydrodynamics; numerical simulation; MITIGATION; CODE;
D O I
10.1088/1361-6595/add051
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
Laser-driven tin droplets represent the primary technique for generating extreme ultraviolet (EUV) radiation in lithography light sources. The implementation of a vertical external magnetic field is a critical strategy for reducing the ion debris produced by the tin plasma. Nonetheless, the detailed mechanisms through which the external magnetic field affects ion debris dynamics have not yet been fully elucidated. In our study, numerical simulations were conducted using the radiation hydrodynamics code FLASH to investigate the magnetohydrodynamic properties of tin plasma under an external magnetic field with a strength of 1 T. Our results reveal, for the first time, the intermediate-timescale (tens to hundreds of nanoseconds) evolution of tin plasma under an external magnetic field, providing new insights into the mechanisms of ion debris mitigation in EUV lithography systems. The magnetic field guides the plasma from the front and rear surfaces of the target to flow to both sides, forming a vortex street phenomenon, accompanied by backflow opposing the vortex street flow. Beyond the vortex region, the plasma transitions to laminar flow, where hydrodynamic instabilities between layers of varying velocities are significantly suppressed. These phenomena are recognized as significant factors to the effective trapping of tin plasma by an externally applied magnetic field in a vertical configuration.
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页数:10
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共 33 条
[31]   Characterization of various Sn targets with respect to debris and fast ion generation [J].
Ueno, Yoshifumi ;
Hoshino, Hideo ;
Ariga, Tatsuya ;
Miura, Taisuke ;
Nakano, Masaki ;
Komori, Hiroshi ;
Soumagne, Georg ;
Endo, Akira ;
Mizoguchi, Hakaru ;
Sumitani, Akira ;
Toyoda, Koichi .
EMERGING LITHOGRAPHIC TECHNOLOGIES XI, PTS 1 AND 2, 2007, 6517
[32]   Enabling sub-10nm node lithography: presenting the NXE:3400B EUV scanner [J].
van de Kerkhof, Mark ;
Jasper, Hans ;
Levasier, Leon ;
Peeters, Rudy ;
van Es, Roderik ;
Bosker, Jan-Willem ;
Zdravkov, Alexander ;
Lenderink, Egbert ;
Evangelista, Fabrizio ;
Broman, Par ;
Bilski, Bartosz ;
Last, Thorsten .
EXTREME ULTRAVIOLET (EUV) LITHOGRAPHY VIII, 2017, 10143
[33]   Characterization and optimization of tin particle mitigation and EUV conversion efficiency in a laser produced plasma EUV light source [J].
Yanagida, Tatsuya ;
Nagano, Hitoshi ;
Wada, Yasunori ;
Yabu, Takayuki ;
Nagai, Shinji ;
Soumagne, Georg ;
Hori, Tsukasa ;
Kakizaki, Kouji ;
Sumitani, Akira ;
Fujimoto, Junichi ;
Mizoguchi, Hakaru ;
Endo, Akira .
EXTREME ULTRAVIOLET (EUV) LITHOGRAPHY II, 2011, 7969