Electron-induced dissociation of HFO1234ze: dissociative electron attachment and dissociative ionization

被引：0

作者：

Lyshchuk, Hlib ^{[1
,2
]}

van Rijn, Marnik Metting ^{[3
]}

Paul, Anirban ^{[1
]}

Kocisek, Jaroslav ^{[1
]}

Rankovic, Milos ^{[1
]}

Nag, Pamir ^{[1
]}

Fedor, Juraj ^{[1
]}

机构：

[1] Czech Acad Sci, J Heyrovsky Inst Phys Chem, Dolejskova 3, Prague 18223, Czech Republic

[2] Univ Chem & Technol, Dept Phys Chem, Tech 5, Prague 16628, Czech Republic

[3] Swiss Fed Inst Technol, Inst Power Syst & High Voltage Technol, Phys Str 3, CH-8092 Zurich, Switzerland

来源：

PHYSICA SCRIPTA | 2025年 / 100卷 / 05期

基金：

瑞士国家科学基金会;

关键词：

attachment; dissociative; ionization; resonances; CROSS-SECTIONS; NEGATIVE-IONS; IMPACT; SCATTERING; ATOMS;

D O I：

10.1088/1402-4896/adcb77

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We studied free electron collision-induced fragmentation of HFO1234ze(E) (C3H2F4). The motivation of the present study is to assess the possibility of using this gas in resistive plate chamber detectors and for the interest in its electron-induced decomposition. Two electron-collision setups, which complement each other, are used. Additionally, the interpretation of the data is supported by quantum chemical calculations. We provide absolute partial cross sections both for the dissociative electron attachment and for the positive ionization. We also report the ionization energy of HFO1234ze(E) and the appearance energies of selected fragments. A surprising finding of the current study is that the dominant anionic fragment from the dissociative electron attachment is the bifluoride anion [F-H-F](-).

引用

页数：11

共 48 条

[1] Results about HF production and bakelite analysis for the CMS resistive plate chambers [J].

Abbrescia, M. ;

Colaleo, A. ;

Guida, R. ;

Iaselli, G. ;

Loddo, F. ;

Maggi, M. ;

Marangelli, B. ;

Natali, S. ;

Nuzzo, S. ;

Pugliese, G. ;

Ranieri, A. ;

Romano, F. ;

Roselli, G. ;

Trentadue, R. ;

Tupputi, S. ;

Cavallo, N. ;

Fabozzi, F. ;

Paolucci, P. ;

Piccolo, D. ;

Polese, G. ;

Sciacca, C. ;

Belli, G. ;

Necchi, M. ;

Ratti, S. ;

Riccardi, C. ;

Torre, P. ;

Vitulo, P. ;

Anguelov, T. ;

Genchev, V. ;

Panev, B. ;

Piperov, S. ;

Sultanov, G. ;

Vankov, P. ;

Dimitrov, A. ;

Litov, L. ;

Pavlov, B. ;

Petkov, P. .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2008, 594 (02) :140-147

[2] STUDY OF TRIPLET-STATES AND SHORT-LIVED NEGATIVE-IONS BY MEANS OF ELECTRON-IMPACT SPECTROSCOPY [J].

ALLAN, M .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1989, 48 (3-4) :219-351

[3]

[Anonymous], 2010, J. Chem. Phys., V132, P154104, DOI DOI 10.1063/1.3382344

[4] DENSITY-FUNCTIONAL THERMOCHEMISTRY .3. THE ROLE OF EXACT EXCHANGE [J].

BECKE, AD .

JOURNAL OF CHEMICAL PHYSICS, 1993, 98 (07) :5648-5652

[5] Vibrational Feshbach resonances in uracil and thymine [J].

Burrow, PD ;

Gallup, GA ;

Scheer, AM ;

Denifl, S ;

Ptasinska, S ;

Märk, T ;

Scheier, P .

JOURNAL OF CHEMICAL PHYSICS, 2006, 124 (12)

[6] New RPC gas mixtures for large area apparatuses [J].

Cardarelli, R. ;

Di Stante, L. ;

Liberti, B. ;

Paolozzi, L. ;

Pastori, E. ;

Santonico, R. .

JOURNAL OF INSTRUMENTATION, 2014, 9

[7] THE RELATIONSHIP OF THE VIRTUAL ORBITALS OF SELF-CONSISTENT-FIELD THEORY TO TEMPORARY NEGATIVE-IONS IN ELECTRON-SCATTERING FROM MOLECULES [J].

CHEN, DH ;

GALLUP, GA .

JOURNAL OF CHEMICAL PHYSICS, 1990, 93 (12) :8893-8901

[8] Multiple ionization of helium and krypton by electron impact close to threshold:: appearance energies and Wannier exponents [J].

Denifl, S ;

Gstir, B ;

Hanel, G ;

Feketeova, L ;

Matejcik, S ;

Becker, K ;

Stamatovic, A ;

Scheier, P ;

Märk, TD .

JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 2002, 35 (22) :4685-4694

[9] Crossover from hydrogen to chemical bonding [J].

Dereka, Bogdan ;

Yu, Qi ;

Lewis, Nicholas H. C. ;

Carpenter, William B. ;

Bowman, Joel M. ;

Tokmakoff, Andrei .

SCIENCE, 2021, 371 (6525) :160-+

[10] CALCULATION OF ABSOLUTE ELECTRON-IMPACT IONIZATION CROSS-SECTION FUNCTIONS FOR SINGLE IONIZATION OF HE, NE, AR, KR, XE, N AND F [J].

DEUTSCH, H ;

MARK, TD .

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 1987, 79 (03) :R1-R8

← 1 2 3 4 5 →