Soft X-ray photoelectron spectroscopy under real ambient pressure conditions

被引：0

作者：

Wada, Tetsuya ^{[1
]}

Horio, Masafumi ^{[1
]}

Liu, Yifu ^{[1
]}

Murano, Yu ^{[1
]}

Sakurai, Haruto ^{[1
]}

Sumi, Toshihide ^{[1
]}

Miyamoto, Masashige ^{[1
]}

Yamamoto, Susumu ^{[2
,3
]}

Matsuda, Iwao ^{[1
,2
]}

机构：

[1] Univ Tokyo, Inst Solid State Phys ISSP, Kashiwa, Chiba 2778581, Japan

[2] Tohoku Univ, Int Ctr Synchrotron Radiat Innovat Smart SRIS, Sendai, Miyagi 9808577, Japan

[3] Tohoku Univ, Inst Multidisciplinary Res Adv Mat IMRAM, Sendai, Miyagi 9808577, Japan

来源：

APPLIED PHYSICS EXPRESS | 2025年 / 18卷 / 03期

基金：

日本学术振兴会;

关键词：

ambient pressure X-ray photoelectron spectroscopy; surface; soft X-ray; synchrotron radiation; X-ray photoelectron spectroscopy; operando measurement; gas/solid interface; SCATTERING CROSS-SECTIONS; ELECTRON-SCATTERING; CO2;

D O I：

10.35848/1882-0786/adbda8

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have developed a measurement system for soft X-ray ambient pressure photoelectron spectroscopy at BL08U of NanoTerasu. An excitation light of 800 eV was introduced by a vacuum tube terminated with a SiN window. Photoelectrons were detected through a phi 24 mu m aperture at the electron lens entrance of a differentially pumped analyzer. The Au 4f core-level spectra of a Au film were measured up to atmospheric pressure (1 bar) with He, to 1 bar with H2, and to 0.4 bar with N2. The system extends applications of operando experiments for the real functional materials.

引用

页数：4

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