A Beginner's Guide to Cryo-EM for Battery Research

被引：0

作者：

Liang, Keyue ^{[1
]}

Yuan, Xintong ^{[1
]}

Chen, Xin ^{[1
]}

Liu, Bo ^{[1
]}

Kim, Jung Tae ^{[1
]}

Yu, Jiayi ^{[1
]}

Zhao, Dingyi ^{[1
]}

Li, Yuzhang ^{[1
]}

机构：

[1] Univ Calif Los Angeles, Dept Chem & Biomol Engn, Los Angeles, CA 90095 USA

来源：

NANO LETTERS | 2025年 / 25卷 / 18期

关键词：

cryogenic electron microscopy (cryo-EM); battery materials; beam-sensitive materials; low-dose imaging; four-dimensional scanning transmission electron microscopy (4D-STEM); CRYOGENIC ELECTRON-MICROSCOPY; SOLID-LIQUID INTERFACES; LITHIUM-METAL; INTERPHASE; CHEMISTRY;

D O I：

10.1021/acs.nanolett.5c00740

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Cryogenic electron microscopy (cryo-EM) has shown great promise in preserving and characterizing beam-sensitive battery materials and interfaces at atomic resolution. With the growing interest in adopting cryo-EM for battery research, this review provides detailed and practical guidance for researchers on cryo-EM workflows including sample preparation and transfer, imaging, data acquisition, and analysis. Strategies for minimizing artifacts during sample preparation and imaging processes are discussed along with approaches to address potential pitfalls in data analysis to ensure accurate interpretation. Finally, this review explores the challenges and opportunities for advancing the cryo-EM technique to further enhance its impact on future developments in battery research.

引用

页码：7210 / 7223

页数：14

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