International round-robin test for electromechanical properties of HTS wires under uniaxial tension at liquid nitrogen temperature

被引:0
作者
Shin, H. S. [1 ]
Diaz, M. A. [1 ,2 ]
Osamura, K. [3 ]
Zhao, Y. [4 ]
Zhang, Y. [5 ]
Falorio, I [5 ]
Bagrets, N. [6 ]
Zhang, X. [7 ]
机构
[1] GyeongKuk Natl Univ, Green Fus Mech Syst Res Ctr, Andong 36729, South Korea
[2] Aurora State Coll Technol, Sch Engn, ZA-3200 Baler, Aurora, Philippines
[3] Res Inst Appl Sci, Kyoto 6068202, Japan
[4] Shanghai Jiao Tong Univ, Shanghai 200240, Peoples R China
[5] SuperPower Inc, Glenville, NY 12302 USA
[6] Karlsruhe Inst Technol, Inst Tech Phys, Eggenstein Leopoldshafen, Germany
[7] Lanzhou Univ, Key Lab Mech Disaster & Environm, Lanzhou 730000, Gansu, Peoples R China
基金
新加坡国家研究基金会;
关键词
high-temperature superconducting wires; stress-based measurement; reversible stress limit; retention stress limit; critical current; standard uncertainty; YBCO COATED CONDUCTORS; AXIAL-STRAIN; SUPERCONDUCTORS;
D O I
10.1088/1361-6668/add423
中图分类号
O59 [应用物理学];
学科分类号
摘要
As superconducting wires have become more prevalent, it has become increasingly important to establish reliable and standardized methods for evaluating their electromechanical properties (EMPs) at cryogenic temperatures. An international round-robin test (RRT) was conducted to assess the EMPs of four commercially available high-temperature superconducting (HTS) tapes as an activity to establish a standard for the EMP test method. Six laboratories participated in the RRT, adhering to the guidelines. During tensile testing of the HTS wires at 77 K, critical current (Ic) measurements were performed using a stress-based test method. This method streamlined the testing procedure by changing stress intervals from broad to narrow as the applied stress approached the Ic degradation point while eliminating the need for dedicated extensometers. The EMPs of the reversible stress limit (Rrev) and retention stress limit (Rret) for Ic degradation were defined based on specific criteria for 99% Ic0 recovery and 95% Ic0 retention. Once the RRT participants reported their test results, statistical analysis tools such as ANOVA were employed to identify sources of variation and assess their magnitude in the results. The primary source of the relative standard uncertainty was the effect of inter-laboratory scattering. The RRT results are utilized to develop an international standard for evaluating EMPs of HTS wires through Ic measurements under uniaxial tension at liquid nitrogen temperature. These RRT analysis results offer valuable insights into potential sources and magnitudes of measurement uncertainties, ultimately contributing to standardized test procedures for accurate and reliable EMP characterization of HTS wires.
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页数:18
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