In-beam tests of double-sided silicon strip detector modules for the BM@N experiment

被引:0
作者
Dementev, D. [1 ]
Diaz, R. Arteche [1 ,4 ]
Sanchez, C. Ceballos [1 ]
Kolozhvari, A. [1 ]
Leontyev, V. [1 ,2 ]
Maltsev, N. [3 ]
Murin, Yu. [1 ]
Alvarez, A. Rodriguez [1 ,4 ]
Rufanov, I. [1 ]
Sheremetev, A. [1 ]
Shitenkov, M. [1 ]
Zherebchevsky, V. [3 ]
机构
[1] Joint Inst Nucl Res, Veksler & Baldin Lab High Energy Phys, Dubna 141980, Moscow, Russia
[2] Lomonosov Moscow State Univ, 27-4 Lomonosovsky Prospekt,GSP-1, Moscow 119991, Russia
[3] St Petersburg Univ, Universitetskaya emb 13B, St Petersburg 199034, Russia
[4] Ctr Technol Applicat & Nucl Dev, Havana, Cuba
关键词
BM@N experiment; Silicon tracking system; Double-sided silicon microstrip sensor; VECTOR FINDER TOOLKIT; TRACK RECONSTRUCTION; NICA;
D O I
10.1016/j.nima.2025.170390
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The results of the in-beam tests of the final version of the DSSD modules for the Silicon Tracking System of BM@N experiment at JINR NICA facility are presented. Each module consists of a double-sided microstrip silicon sensor and front-end electronics connected to each other via low-mass aluminum microcables. Investigations of the module characteristics and tests of the readout electronics were done at proton synchrocyclotron SC-1000 in Petersburg Nuclear Physics Institute. Signal-to-noise ratio, spatial resolution and detection efficiency were measured. Performance of the areas with strips with a second metallization layer and strips with bonding failures was studied. Dependencies of the main operation parameters of the modules on the bias voltage and ADC threshold were also obtained. The average registration efficiency of the modules resulted in values higher than 99% with signal-to-noise ratio typical values for both sides of the sensor not less than 21 and a spatial resolution of 15.4 mu m.
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页数:9
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