Measurement System to Determine the Seebeck Coefficient and Electrical Conductivity of Thin Films

被引:0
作者
Dalkiranis, Gustavo G. [1 ]
Bocchi, Joao H. C. [1 ]
Torres, Bruno Bassi Millan [1 ]
Lopeandia, Aitor F. [2 ,3 ,4 ]
Oliveira Jr, Osvaldo N. [1 ]
Faria, Gregorio C. [1 ]
机构
[1] Univ Sao Paulo, Sao Carlos Inst Phys, BR-13560970 Sao Carlos, SP, Brazil
[2] Univ Autonoma Barcelona, Dept Fis, Cerdanyola Del Valles 08193, Spain
[3] CSIC, Catalan Inst Nanosci & Nanotechnol ICN2, Barcelona 08193, Spain
[4] BIST, Barcelona 08193, Spain
基金
巴西圣保罗研究基金会;
关键词
Temperature measurement; Voltage measurement; Conductivity; Electrodes; Temperature; Semiconductor device measurement; Electric variables measurement; Thermoelectric materials; Reactive power; Conductivity measurement; Electrical conductivity; instrumentation; measurement system; power factor (PF); Seebeck coefficient; thermoelectricity; SIMPLE APPARATUS; PERFORMANCE;
D O I
10.1109/TIM.2025.3553254
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Thermoelectric (TE) materials are promising for energy-generating devices, and their design depends on a fast, precise determination of their Seebeck coefficient and electrical conductivity. Herein, a low-cost setup was developed to determine the Seebeck coefficient and electrical conductivity of thin films, allowing the calculation of the power factor (PF) (PF=S-2 sigma) . The system was validated by measuring the Seebeck coefficient and electrical conductivity of poly(3,4-ethylenedioxythiophene) polystyrene sulfonate (PEDOT:PSS), a widely used material in organic electronics and TE generators. The results demonstrate the high resolution of our system, with obtained values of 0.1 mu V/K for Seebeck coefficient, 0.1 S/cm for electrical conductivity, and 0.1 mu W/K-2 for PF. A detailed description of the fabrication of the measurement setup is provided, with the aim of making thermoelectricity accessible to any research laboratory, even in places with limited budgets.
引用
收藏
页数:6
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