Measurement System to Determine the Seebeck Coefficient and Electrical Conductivity of Thin Films

被引:0
作者
Dalkiranis, Gustavo G. [1 ]
Bocchi, Joao H. C. [1 ]
Torres, Bruno Bassi Millan [1 ]
Lopeandia, Aitor F. [2 ,3 ,4 ]
Oliveira Jr, Osvaldo N. [1 ]
Faria, Gregorio C. [1 ]
机构
[1] Univ Sao Paulo, Sao Carlos Inst Phys, BR-13560970 Sao Carlos, SP, Brazil
[2] Univ Autonoma Barcelona, Dept Fis, Cerdanyola Del Valles 08193, Spain
[3] CSIC, Catalan Inst Nanosci & Nanotechnol ICN2, Barcelona 08193, Spain
[4] BIST, Barcelona 08193, Spain
基金
巴西圣保罗研究基金会;
关键词
Temperature measurement; Voltage measurement; Conductivity; Electrodes; Temperature; Semiconductor device measurement; Electric variables measurement; Thermoelectric materials; Reactive power; Conductivity measurement; Electrical conductivity; instrumentation; measurement system; power factor (PF); Seebeck coefficient; thermoelectricity; SIMPLE APPARATUS; PERFORMANCE;
D O I
10.1109/TIM.2025.3553254
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Thermoelectric (TE) materials are promising for energy-generating devices, and their design depends on a fast, precise determination of their Seebeck coefficient and electrical conductivity. Herein, a low-cost setup was developed to determine the Seebeck coefficient and electrical conductivity of thin films, allowing the calculation of the power factor (PF) (PF=S-2 sigma) . The system was validated by measuring the Seebeck coefficient and electrical conductivity of poly(3,4-ethylenedioxythiophene) polystyrene sulfonate (PEDOT:PSS), a widely used material in organic electronics and TE generators. The results demonstrate the high resolution of our system, with obtained values of 0.1 mu V/K for Seebeck coefficient, 0.1 S/cm for electrical conductivity, and 0.1 mu W/K-2 for PF. A detailed description of the fabrication of the measurement setup is provided, with the aim of making thermoelectricity accessible to any research laboratory, even in places with limited budgets.
引用
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页数:6
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