Retina algorithm for heavy-ion tracking in single-event effects localization

被引:0
作者
Wen-Di Deng [1 ]
Jin-Chuan Wang [1 ]
Hui-Peng Pan [1 ]
Wei Zhang [1 ]
Jian-Song Wang [2 ]
Fu-Qiang Wang [3 ]
Zi-Li Li [2 ]
Ren-Zhuo Wan [3 ]
机构
[1] School of Electronics and Electrical Engineering, Wuhan Textile University, Wuhan
[2] School of Science, Huzhou University, Huzhou
[3] Strong-coupling Physics International Research Laboratory, Huzhou University, Huzhou
基金
中国国家自然科学基金;
关键词
Heavy ion; Iterative retina algorithm; Particle tracking; Retina algorithm; Single-event effects;
D O I
10.1007/s41365-025-01679-3
中图分类号
学科分类号
摘要
This study presents a real-time tracking algorithm derived from the retina algorithm, designed for the rapid, real-time tracking of straight-line particle trajectories. These trajectories are detected by pixel detectors to localize single-event effects in two-dimensional space. Initially, we developed a retina algorithm to track the trajectory of a single heavy ion and achieved a positional accuracy of 40 μm. This was accomplished by analyzing trajectory samples from the simulations using a pixel sensor with a 72 × 72 pixel array and an 83 μm pixel pitch. Subsequently, we refined this approach to create an iterative retina algorithm for tracking multiple heavy-ion trajectories in single events. This iterative version demonstrated a tracking efficiency of over 97%, with a positional resolution comparable to that of single-track events. Furthermore, it exhibits significant parallelism, requires fewer resources, and is ideally suited for implementation in field-programmable gate arrays on board-level systems, facilitating real-time online trajectory tracking. © The Author(s), under exclusive licence to China Science Publishing & Media Ltd. (Science Press), Shanghai Institute of Applied Physics, the Chinese Academy of Sciences, Chinese Nuclear Society 2025.
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共 45 条
  • [1] Pearton S.J., Aitkaliyeva A., Xian M., Et al., Review-Radiation damage in wide and ultra-wide bandgap semiconductors, ECS J. Solid State Sci. Technol, 10, (2021)
  • [2] Hoeffgen S.K., Metzger S., Steffens M., Et al., Investigating the effects of cosmic rays on space electronics, Front. Phys, 8, (2020)
  • [3] Dyer C., Hands A., Ryden K., Et al., Extreme atmospheric radiation environments and single event effects, IEEE Trans. Nucl. Sci, 65, 1, pp. 432-438, (2017)
  • [4] Zhao Y.F., Wang L., Yue S.G., Et al., Single event effect and its hardening technique in nano-scale CMOS integrated circuits, Acta Electron. Sin, 46, 10, pp. 2511-2518, (2018)
  • [5] Pease R.L., Total ionizing dose effects in bipolar devices and circuits, IEEE Trans. Nucl. Sci, 50, pp. 539-551, (2003)
  • [6] Srour J.R., Palko J.W., Displacement damage effects in irradiated semiconductor devices, IEEE Trans. Nucl. Sci, 60, pp. 1740-1766, (2013)
  • [7] Chen S., Ryden K., Hands G., Et al., Assessment of neutron irradiation effects via PKA spectra, displacement damage, and gas production: Application to reactor pressure vessel, Nucl. Mater. Energy, 37, (2023)
  • [8] Sexton F.W., Destructive single-event effects in semiconductor devices and ICs, IEEE Trans. Nucl. Sci, 50, 3, pp. 603-621, (2003)
  • [9] Lopez-Calle I., Franco A.I., Comparison of cubesat and microsat catastrophic failures in function of radiation and debris impact risk, Sci. Rep, 13, (2023)
  • [10] Nwankwo V.U., Jibiri N.N., Kio M.T., Et al., The impact of space radiation environment on satellites operation in near-earth space, Satel. Miss. Technol, (2020)