Electronics packaging materials and component-level degradation monitoring

被引:0
|
作者
Inamdar, Adwait [1 ]
Van Driel, Willem D. [1 ]
Zhang, Guoqi [1 ]
机构
[1] Delft Univ Technol, Microelect Dept, Elect Components Technol & Mat ECTM, Delft, Netherlands
来源
关键词
electronics packaging; encapsulation material; moulding compounds; physics of degradation; thermomechanical ageing; failure mechanisms; digital twin; prognostics and health management; RELIABILITY;
D O I
10.3389/felec.2025.1506112
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Electronic components are complex systems consisting of a combination of different materials, which undergo degenerative changes over time following the second law of thermodynamics. The loss of their quality or functionality is reflected in degraded performance or behaviour of electronic components, which can lead to failures during their operation lifetime. Thus, it is crucial to understand the physics of material degradation and the factors causing it to ensure component reliability. This paper focuses on the physics-of-degradation of packaging materials, which are typically exposed the most to the environmental and operating loads. The content of this article is organised into three parts. First, an overview of the packaging technology and encapsulating materials is presented. Then, the most common degradation-causing factors and package-associated failure modes are reviewed. Lastly, the hardware requirements are discussed, including specialised sensors, measurement techniques, and Digital Twins, to capture the degradation effects and facilitate component-level health monitoring for microelectronics.
引用
收藏
页数:11
相关论文
共 50 条
  • [1] Component-level dataflow analysis
    Rountev, A
    COMPONENT-BASED SOFTWARE ENGINEERING, PROCEEDINGS, 2005, 3489 : 82 - 89
  • [2] Component-level parallelization of triangular decompositions
    Maza, Marc Moreno
    Xie, Yuzhen
    PASCO'07: Proceedings of the 2007 International Workshop on Parallel Symbolic Computation, 2007, : 69 - 77
  • [3] INTERFACING MICROCOMPUTER - COMPONENT-LEVEL APPROACH
    KRAUSMAN, DT
    BEHAVIOR RESEARCH METHODS & INSTRUMENTATION, 1978, 10 (04): : 519 - 521
  • [4] Modeling and Simulation in Composite Materials: Integration from Nanostructure to Component-Level Design
    Gupta, Nikhil
    JOM, 2013, 65 (02) : 136 - 139
  • [5] Modeling and Simulation in Composite Materials: Integration from Nanostructure to Component-Level Design
    Nikhil Gupta
    JOM, 2013, 65 : 136 - 139
  • [6] Automated Component-Level Evaluation: Present and Future
    Hanbury, Allan
    Mueller, Henning
    MULTILINGUAL AND MULTIMODAL INFORMATION ACCESS EVALUATION, 2010, 6360 : 124 - +
  • [7] Developing and Distributing Component-Level VHDL Models
    J. Scott Calhoun
    Vijay K. Madisetti
    Robert B. Reese
    Thomas Egolf
    Journal of VLSI signal processing systems for signal, image and video technology, 1997, 15 : 111 - 126
  • [8] Component-level programming: a revolution in software technology
    Maurer, Peter M.
    Varanasi, Murali
    Katkoori, Srinivas
    Mak, Wai-Kai
    Proceedings - Frontiers in Education Conference, 1999, 2 : 1 - 11
  • [9] Developing and distributing component-level VHDL models
    Calhoun, JS
    Madisetti, VK
    Reese, RB
    Egolf, T
    JOURNAL OF VLSI SIGNAL PROCESSING SYSTEMS FOR SIGNAL IMAGE AND VIDEO TECHNOLOGY, 1997, 15 (1-2): : 111 - 126
  • [10] COMPONENT-LEVEL ANALYSIS OF COMPOSITE BOX BEAMS
    KLANG, EC
    KUO, TM
    AIAA/ASME/ASCE/AHS/ASC 30TH STRUCTURES, STRUCTURAL DYNAMICS AND MATERIALS CONFERENCE, PTS 1-4: A COLLECTION OF TECHNICAL PAPERS, 1989, : 1765 - 1771