A digital twin solution for fault detection in time-critical IIoT applications

被引:0
|
作者
Ranpariya, Amish [1 ]
Sharma, Sangeeta [1 ]
机构
[1] Natl Inst Technol, Comp Sci & Engn Dept, Hamirpur 177005, Himachal Prades, India
关键词
Condition monitoring; digital twin; fault detection; neural networks; random forest; sensors; SYSTEM; CLASSIFICATION; SENSOR;
D O I
10.1080/17477778.2025.2453725
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
IIoT sensor data plays a pivotal role in monitoring the industrial system's health and identifying potential faults. However, traditional fault detection approaches often face challenges such as network latency, limited accuracy, and resource-intensive processing. This paper introduces an end-to-end Digital Twin solution that enhances fault detection for IIoT systems. The solution is powered by two key innovations: the integration of a Digital Twin architecture that leverages a collaborative cloud-edge approach for real-time monitoring, and the use of a lightweight two-phased machine-learning ensemble model optimized for resource-constrained environments. The great performance achieved across various fault scenarios demonstrates the effectiveness of the proposed approach. The model provides an average accuracy of 99.71% with a mere 4.8 ms of average estimation delay. These advancements ensure both high accuracy and rapid response times, providing a robust solution for proactive fault detection in dynamic industrial environments.
引用
收藏
页数:14
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